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revisions ltr description date (yr-mo-da) approved a correction to table i differential nonli nearity test limit. editorial changes throughout. - drw 00-08-25 raymond monnin b update drawing to current requirements. ? drw 06-08-30 raymond monnin rev sheet rev sheet rev status rev b b b b b b b b b b b of sheets sheet 1 2 3 4 5 6 7 8 9 10 11 pmic n/a prepared by sandra rooney defense supply center columbus standard microcircuit drawing checked by sandra rooney columbus, ohio 43218-3990 http://www.d scc.dla.mil this drawing is available for use by all departments approved by michael a. frye microcircuit, linear, 12-bit serial and agencies of the department of defense drawing approval date 94-01-20 dacport, monolithic silicon amsc n/a revision level b size a cage code 67268 5962-93204 sheet 1 of 11 dscc form 2233 apr 97 5962-e637-06
standard microcircuit drawing size a 5962-93204 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 2 dscc form 2234 apr 97 1. scope 1.1 scope . this drawing documents two product assurance class leve ls consisting of high reliability (device classes q and m) and space application (device class v). a c hoice of case outlines and lead finishes ar e available and are reflected in the par t or identifying number (pin). when available, a choice of radiation hardness assu rance (rha) levels are reflected in the pin. 1.2 pin . the pin is as shown in the following example: 5962 - 93204 01 m e a federal stock class designator rha designator (see 1.2.1) device type (see 1.2.2) device class designator case outline (see 1.2.4) lead finish (see 1.2.5) \ / (see 1.2.3) \/ drawing number 1.2.1 rha designator . device classes q and v rha marked devices m eet the mil-prf-38535 specif ied rha levels and are marked with the appropriate rha designator. device cl ass m rha marked devices m eet the mil-prf-38535, appendix a specified rha levels and are marked with the appropriate rha designator. a dash (-) indicates a non-rha device. 1.2.2 device type . the device type identifies the circuit function as follows: device type generic number circuit function 01 ad7243 12-bit serial dacport 1.2.3 device class designator . the device class designator is a single le tter identifying the product assurance level as follows: device class device requirements documentation m vendor self-certification to the requirements for mil-std-883 compliant, non- jan class level b microcircuits in accordance with mil-prf-38535, appendix a q or v certification and qua lification to mil-prf-38535 1.2.4 case outline . the case outline is as designated in mil-std-1835 as follows: outline letter descriptive designator terminals package style e gdip1-t16 or cdip2-t16 16 dual-in-line 1.2.5 lead finish . the lead finish is as specified in mil-pr f-38535 for device classes q and v or mil-prf-38535, appendix a for device class m.
standard microcircuit drawing size a 5962-93204 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 3 dscc form 2234 apr 97 1.3 absolute maximum ratings . 1 /,2 / v dd to agnd, dgnd ....................................................................................... -0.3 v dc to +17 v dc v ss to agnd, dgnd ....................................................................................... +0.3 v dc to -17 v dc agnd to dg nd ............................................................................................... -0.3 v dc to v dd + 0.3 v dc v out to agnd 3 / ............................................................................................ -6 v dc to v dd + 0.3 v dc refout to agnd ........................................................................................... 0 v dc to v dd refin to agnd............................................................................................... -0.3 v dc to v dd + 0.3 v dc digital inputs to dgnd ..................................................................................... -0.3 v dc to v dd + 0.3 v dc sdo to dgnd.................................................................................................. -0.3 v dc to v dd + 0.3 v dc storage temperat ure r ange .............................................................................. -65 c to +150 c lead temperature (solderi ng, 10 seconds )....................................................... +300 c power dissipation (p d ) (t a = +75 c) 4 / .......................................................... 450 mw 1.4 recommended operating conditions . positive supply voltage range (v dd ) ................................................................. +12 v dc to +15 v dc 5 / negative supply voltage range (v ss ) ................................................................ 0 v dc or -12 v dc to -15 v dc 5 / voltage reference input (refin)...................................................................... +5 v dc ambient operating tem perature range .............................................................. -55 c to +125 c 2. applicable documents 2.1 government specif ication, standards, and handbooks . the following specificati on, standards, and handbooks form a part of this drawing to the extent specified herein. unless otherwise specified, the issues of thes e documents are those cited in t he solicitation or contract. department of defense specification mil-prf-38535 - integrated circuits, manufacturing, general specification for. department of defense standards mil-std-883 - test met hod standard microcircuits. mil-std-1835 - interface standard electronic component case outlines. department of defense handbooks mil-hdbk-103 - list of st andard microcircuit drawings. mil-hdbk-780 - standard microcircuit drawings. (copies of these document s are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from the standardization document order desk, 700 robbins avenue, build ing 4d, philadelphia, pa 19111-5094.) 2.2 order of precedence . in the event of a conflict between the text of this drawing and the refe rences cited herei n, the text of this drawing takes precedence. nothing in this documen t, however, supersedes applicable laws and regulations unless a specific exempti on has been obtained. ________ 1 / stresses above the absolute maximum rating may cause permanent damage to the device. extended operation at the maximum levels may degrade performance and affect reliability. 2 / t a = +25 c unless otherwise specified. 3 / the outputs may be shorted to voltages in this range provided the power dissipation of the package is as specified. short circuit current is typically 80 ma. 4 / derate power dissipation above t a = +75 c by 6 mw/ c. 5 / power supply tolerance 5%.
standard microcircuit drawing size a 5962-93204 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 4 dscc form 2234 apr 97 3. requirements 3.1 item requirements . the individual item requirements for device classes q and v shall be in accordance with mil-prf-38535 and as specified herein or as modified in the device manufacture r's quality management (qm) plan. the modification in the qm plan shall not affe ct the form, fit, or function as described herein. the individual item requirements for device class m shall be in accordance with mil-prf-38535, appendix a for non-jan class level b devices and as specified herein. 3.2 design, construction, and physical dimensions . the design, construction, and physical dimensions shall be as specified in mil-prf-38535 and herein for device classes q and v or mil-prf-38535, appendix a and herein for device class m. 3.2.1 case outline . the case outline shall be in accordance with 1.2.4 herein. 3.2.2 terminal connections . the terminal connections shall be as specified on figure 1. 3.3 electrical performance characteri stics and postirradiati on parameter limits . unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limit s are as specified in table i and shall apply over th e full ambient operating te mperature range. 3.4 electrical test requirements . the electrical test requirements shall be the subgroups specified in table ii. the electrical tests for each subgroup are defined in table i. 3.5 marking . the part shall be marked with the pin listed in 1.2 her ein. in addition, the manufacturer's pin may also be marked. for packages where marking of t he entire smd pin number is not feasible due to space lim itations, the manufacturer has the option of not marking the "5962-" on the device. for rha product using this option, the rha designator shall still be marked. marking for device classes q and v shall be in accor dance with mil-prf-38535. marking for device class m shall be in accordance with mil-prf-38535, appendix a. 3.5.1 certificat ion/compliance mark . the certification mark for device classes q and v shall be a "qml" or "q" as required in mil-prf-38535. the compliance mark for device class m shall be a "c" as required in mil-prf-38535, appendix a. 3.6 certificate of compliance . for device classes q and v, a certificate of compliance shall be required from a qml-38535 listed manufacturer in order to supply to t he requirements of this draw ing (see 6.6.1 herein). for device class m, a certifica te of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in mil-hdbk-103 (see 6.6.2 herein). the certificate of compliance submitted to dscc-va prior to lis ting as an approved source of supply for this drawing shall affirm that the manufacture r's product meets, for device classes q and v, the requirement s of mil-prf-38535 and herein or for device class m, the require ments of mil-prf-38535, appendix a and herein. 3.7 certificat e of conformance . a certificate of conformanc e as required for device classes q and v in mil-prf-38535 or for device class m in mil-prf-38535, appendix a shall be provided with each lot of microcircuits delivered to this drawing. 3.8 notification of change for device class m . for device class m, notification to dscc-va of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 verification and review for device class m . for device class m, dscc, dscc's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable requir ed documentation. offshore documentation shall be made available onshore at the option of the reviewer. 3.10 microcircuit group assignment for device class m . device class m devices covered by this drawing shall be in microcircuit group number 80 (see mil-prf-38535, appendix a).
standard microcircuit drawing size a 5962-93204 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 5 dscc form 2234 apr 97 table i. electrical performance characteristics . test symbol conditions 1 / -55 c t a +125 c unless otherwise specified group a subgroups device type limits unit min max relative accuracy 2 / ra 1, 2, 3 01 1 lsb differential nonlinearity 2 / dnl guaranteed monotoni c 1, 2, 3 01 0.9 lsb unipolar offset error 2 / uoe dac latch contents all 0s 1, 2, 3 01 5 lsb bipolar zero error bze dac latch contents 2048 1, 2, 3 01 6 lsb full scale error 2 / 3 / ae 1, 2, 3 01 7 lsb voltage reference output refout 1, 2, 3 01 4.95 5.05 v reference load change reflc reference load current (i l ) change (0-100 a) 1, 2, 3 01 -1 mv reference input range 4 / refin 1, 2, 3 01 4.95 5.05 v reference input current rin 1, 2, 3 01 5 a digital input high 2 / voltage v inh 7. 8 01 2.4 v digital input low 2 / voltage v inl 7, 8 01 0.8 v digital input current i in v in = 0 v to v dd , v dd = 15.75 v, v ss = -15.75 v 1, 2, 3 01 1 a input capacitance c in see 4.4.1c 4 01 8 pf digital output low voltage v ol i sink = 1 ma 1, 2, 3 01 0.4 v digital output high voltage v oh i source = 400 a 1, 2, 3 01 4.0 v analog output range resistor r out 1, 2, 3 01 15 30 k ? analog output voltage 5 / ranges v out single supply, v ss = 0 v 1, 2, 3 01 5 10 v dual supplies, v ss = -12 v to - 15 v 5 10 -5 +5 positive power supply current i dd v dd = 15.75 v, v ss = -15.75 v, output unloaded, 10 v range 1, 2, 3 01 12 ma negative power supply current i ss v dd = 15.75 v, v ss = -15.75 v, output unloaded, 10 v range, dual supplies 1, 2, 3 01 4 ma see footnotes at end of table.
standard microcircuit drawing size a 5962-93204 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 6 dscc form 2234 apr 97 table i. electrical performance characteristics - continued. test symbol conditions 1 / -55 c t a +125 c unless otherwise specified group a subgroups device type limits unit min max voltage output settling time, positive full scale 6 / change t ps see 4.4.1c 4 01 12 s voltage output settling time, negative full scale 6 / change t ns v ss = -12 v to -15 v see 4.4.1c 4 01 10 s sclk cycle time 7 / 8 / t 1 sclk mark/space ratio range is 40/60 to 60/40, see figure 2 9, 10, 11 01 200 ns sync to sclk falling edge setup time 7 / 8 / t 2 see figure 2 9, 10, 11 01 50 ns sync to sclk hold time t 3 see figure 2 9 01 120 ns 7 / 8 / 10, 11 190 data setup time 7 / 8 / t 4 see figure 2 9, 10, 11 01 10 ns data hold time 7 / 8 / t 4 see figure 2 9, 10, 11 01 100 ns sync high to ldac low 7 / 8 / t 6 see figure 2 9, 10, 11 01 0 ns ldac pulse width 7 / 8 / t 7 see figure 2 9, 10, 11 01 50 ns ldac high to sync low 7 / 8 / t 6 see figure 2 9, 10, 11 01 0 ns clr pulse width 7 / 8 / t 9 see figure 2 9, 10, 11 01 75 ns sclk falling edge to sd0 t 10 sd0 load capacitance is no 9 01 120 ns valid 7 / 8 / 9 / greater than 50 pf 10, 11 180 1 / v dd = +11.4 v to +15.75 v. v ss = 0 v or ?11.4 v to ?15.75 v. agnd = dgnd = 0 v. refin = +5 v. r l = 2 k ? . c l = 100 pf to agnd. parts are guaranteed ov er this supply range. individual tests are performed with known worst case supply conditions. unless otherwise noted v dd = +11.4 v and v ss = ?11.4 v 2 / v dd = 14.25 v, v ss = 0 v on 10 v range. v dd = 14.25 v, v ss = ?14.25 v on 10 v range. v dd = 11.4 v, v ss = ?11.4 v on 5 v range 3 / measured with respect to refin and includes unipolar and bipolar offset error. 4 / refin is connected to refout for all tests except r in . 5 / analog output voltage ranges are guaranteed by passing of dc accuracy tests. 6 / 0 v to +10 v output range is available only with v dd +14.25 v. 7 / all input signals are specified with t r = t f = 5 ns (10% to 90% 0f 5 v) and ti med from a voltage level of 1.6 v. 8 / subgroups 10 and 11 are measured only at in itial design characterization and after process or design changes which might affect this parameter. this limit is guaranteed even though it is not tested. 9 / t 10 measured only at initial design characte rization and after process or design changes which might affect this parameter. this limit is guaranteed even though it is not tested.
standard microcircuit drawing size a 5962-93204 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 7 dscc form 2234 apr 97 device type 01 case outline e terminal number terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 refin refout clr bin/comp sclk sdin sync dgnd ldac dcen sd0 agnd r ofs v out v ss v dd figure 1. terminal connections .
standard microcircuit drawing size a 5962-93204 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 8 dscc form 2234 apr 97 figure 2. timing waveforms .
standard microcircuit drawing size a 5962-93204 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 9 dscc form 2234 apr 97 4. verification 4.1 sampling and inspection . for device classes q and v, sampling and inspection procedures shall be in accordance with mil-prf-38535 or as modified in the devic e manufacturer's quality m anagement (qm) plan. the modification in the qm plan shall not affect the form, fit, or functi on as described herein. for device class m, sampling and inspection procedures shall be in accordance with mil-prf-38535, appendix a. 4.2 screening . for device classes q and v, screening shall be in accordance with mil-prf- 38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. fo r device class m, screening shall be in accordance with method 5004 of mil-std-883, and shall be conducted on all devices prio r to quality conformance inspection. 4.2.1 additional criteria for device class m . a. burn-in test, method 1015 of mil-std-883. (1) test condition a, b, c, or d. the test circuit shall be maintained by the manuf acturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. the test circuit shall specify the inputs, output s, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015. (2) t a = +125 c, minimum. b. interim and final electrical test parameter s shall be as specified in table ii herein. 4.2.2 additional criteria for device classes q and v . a. the burn-in test duration, test condi tion and test temperature, or approved alte rnatives shall be as specified in the device manufacturer's qm plan in accordance with mil-prf- 38535. the burn-in test circuit shall be maintained under document revision level control of the device manufacturer's technology review board (trb) in accordance with mil-prf-38535 and shall be made available to the acquiring or preparing activity upon request. the test circuit shall specify the inputs, output s, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of mil-std-883. b. interim and final electrical test parameter s shall be as specified in table ii herein. c. additional screening for device class v beyond the require ments of device class q shall be as specified in mil-prf-38535, appendix b. 4.3 qualification inspec tion for device classes q and v . qualification inspection for device classes q and v shall be in accordance with mil-prf-38535. inspections to be performed shall be those specified in mil-prf-38535 and herein for groups a, b, c, d, and e inspecti ons (see 4.4.1 through 4.4.4). 4.4 conformance inspection . technology conformance inspection for classes q and v shall be in accordance with mil-prf-38535 including groups a, b, c, d, and e inspections and as specified herein. quality conformance inspection for device class m shall be in accordance with mil-prf-38535, appendi x a and as specified herein. inspections to be performed for device class m shall be those specifi ed in method 5005 of mil-std-883 and herein for groups a, b, c, d, and e inspections (see 4.4.1 through 4.4.4).
standard microcircuit drawing size a 5962-93204 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 10 dscc form 2234 apr 97 4.4.1 group a inspection . a. tests shall be as spec ified in table ii herein. b. subgroups 5, 6, 10, and 11 in table i, method 5005 of mil-std- 883 shall be omitted. c. subgroup 4 shall be measured only for in itial qualification and after any proce ss or design changes which may affect the parameter. sample size is 15 devices with no failures, and all inputs tested. table ii. electrical test requirements . test requirements subgroups (in accordance with mil-std-883, method 5005, table i) subgroups (in accordance with mil-prf-38535, table iii) device class m device class q device class v interim electrical parameters (see 4.2) 1, 7 1, 7 1, 7 final electrical parameters (see 4.2) 1, 2, 3, 4, 7, 8, 9 1 / 1, 2, 3, 4, 7, 8, 9 1 / 1, 2, 3, 4, 7, 8, 9 1 / group a test requirements (see 4.4) 1, 2, 3, 4, 7, 8, 9 1, 2, 3, 4, 7, 8, 9 1, 2, 3, 4, 7, 8, 9 group c end-point electrical parameters (see 4.4) 1 1 1, 2, 3, 4, 7, 8, 9 group d end-point electrical parameters (see 4.4) 1 1 1 group e end-point electrical parameters (see 4.4) 1 1 1 1 / pda applies to subgroup 1. 4.4.2 group c inspection . the group c inspection end-point electrical param eters shall be as specif ied in table ii herein. 4.4.2.1 additional criteria for device class m . steady-state life test condi tions, method 1005 of mil-std-883: a. test condition a, b, c, or d. the test circuit s hall be maintained by the manufactu rer under document revision level control and shall be made available to the preparing or acquiring activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance wi th the intent specif ied in method 1005 of mil-std-883. b. t a = +125 c, minimum. c. test duration: 1,000 hours, except as permitted by method 1005 of mil-std-883. 4.4.2.2 additional criteria for device classes q and v . the steady-state life test duration, test condition and test temperature, or approved alternatives shall be as spec ified in the device manufacturer's qm pl an in accordance with mil-prf-38535. the test circuit shall be maintained under document revision level c ontrol by the device manufacturer's trb in accordance with mil-prf-38535 and shall be made available to the acquiring or preparing activity upon r equest. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of mil-st d- 883.
standard microcircuit drawing size a 5962-93204 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 11 dscc form 2234 apr 97 4.4.3 group d inspection . the group d inspection end-point electrical param eters shall be as specif ied in table ii herein. 4.4.4 group e inspection . group e inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. end-point electrical parameters shall be as spec ified in table ii herein. b. for device classes q and v, the devices or test vehicl e shall be subjected to radiat ion hardness assured tests as specified in mil-prf-38535 for the rha le vel being tested. for device class m, the devices shall be subjected to radiation hardness assured tests as s pecified in mil-prf-38535, appendix a for t he rha level being tested. all device classes must meet the postirradiat ion end-point electrical parameter limits as defined in table i at t a = +25 c 5 c, after exposure, to the subgroups specified in table ii herein. 5. packaging 5.1 packaging requirements . the requirements for packaging shall be in accordance with mil-prf-38535 for device classes q and v or mil-prf-38535, appendix a for device class m. 6. notes 6.1 intended use . microcircuits conforming to this drawing are int ended for use for government microcircuit applications (original equipment), design applic ations, and logistics purposes. 6.1.1 replaceability . microcircuits covered by this drawing will repl ace the same generic device covered by a contractor prepared specificati on or drawing. 6.1.2 substitutability . device class q devices will replace device class m devices. 6.2 configurati on control of smd's . all proposed changes to existing smd's will be coordinated with the users of record for the individual documents. this c oordination will be accomplished using dd form 1692, engineering change proposal. 6.3 record of users . military and industrial users should inform defens e supply center columbus (dscc) when a system application requires configuration control and which smd's are applicabl e to that system. dscc will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. users of drawings covering microelect ronic devices (fsc 5962) should contac t dscc-va, telephone (614) 692-0544. 6.4 comments . comments on this drawing should be directed to dscc-va , columbus, ohio 43218-3990, or telephone (614) 692-0547. 6.5 abbreviations, symbols, and definitions . the abbreviations, symbols, and defin itions used herein are defined in mil-prf-38535 and mil-hdbk-1331. 6.6 sources of supply . 6.6.1 sources of supply for device classes q and v . sources of supply for device classes q and v are listed in qml-38535. the vendors listed in qml-38535 have submi tted a certificate of co mpliance (see 3.6 herein) to dscc-va and have agreed to this drawing. 6.6.2 approved sources of supply for device class m . approved sources of supply for cl ass m are listed in mil-hdbk-103. the vendors listed in mil-hdbk-103 have agr eed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by dscc-va.
standard microcircuit drawing bulletin date: 06-08-30 approved sources of supply for smd 5962-93204 are listed below for immediate acquisition information only and shall be added to mil-hdbk-103 and qml-38535 during the next re vision. mil-hdbk-103 and qml-38535 will be revised to include the addition or deletion of s ources. the vendors listed below have agr eed to this drawing and a certificate of compliance has been submitted to and accepted by dscc-va. this informati on bulletin is superseded by the next dated revision of mil-hdbk-103 and qml- 38535. dscc maintains an online databas e of all current sources of supply at http://www.d scc.dla.mil/programs/smcr/ . standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962-9320401mea 24355 ad7243sq/883b 1 / the lead finish shown for each pin representing a hermetic package is the most readily available from the manufacturer listed for that part. if the desired lead finish is not listed contact the vendor to determine its availability. 2 / caution . do not use this number for item acquisition. items acquired to this number may not satisfy the performance require ments of this drawing. vendor cage vendor name number and address 24355 analog devices rt 1 industrial park po box 9106 norwood, ma 02062 point of contact: (35361)495999 raheen business park limerick, ireland the information contained herein is di sseminated for convenience only and the government assumes no liability whats oever for any inaccuracies in the information bulletin.

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